SEU: Difference between revisions
Created page with "A '''single event upset''' is a change of state caused by one single ionising particle (ions, electrons, photons) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor. It is not considered to permanently damage the equipment’s functionality. It is an example of a general class of radiation effects in electronic devices called single event effects (SEE). Category:Abbreviations" |
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A '''single event upset''' is a change of state caused by one single ionising particle (ions, electrons, photons) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor. It is not considered to permanently damage the equipment’s functionality. It is an example of a general class of radiation effects in electronic devices called single event effects (SEE). | A '''single event upset''' is a change of state caused by one single ionising particle (ions, electrons, photons) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor. It is not considered to permanently damage the equipment’s functionality. It is an example of a general class of radiation effects in electronic devices called single event effects (SEE). | ||
[[Category:Abbreviations]] | [[Category:Abbreviations]] | ||
[[Category:Scientific terms]] | |||
[[Category:FAPlist]] | |||
Latest revision as of 14:37, 24 March 2026
A single event upset is a change of state caused by one single ionising particle (ions, electrons, photons) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor. It is not considered to permanently damage the equipment’s functionality. It is an example of a general class of radiation effects in electronic devices called single event effects (SEE).