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• 18:14, 16 February 2026 Vigen talk contribs created page SEU (Created page with "A '''single event upset''' is a change of state caused by one single ionising particle (ions, electrons, photons) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor. It is not considered to permanently damage the equipment’s functionality. It is an example of a general class of radiation effects in electronic devices called single event effects (SEE). Category:Abbreviations") Tag: Visual edit